Herakles (UGCT - XMI)

Description

The combined micro-CT - micro-XRF system Herakles combines three scanning stages for extensive sample characterization. One high-resolution CT stage is complemented with two micro-XRF stages, where the three stages are linked by an innovative air-beared positioning system which offers a sub-micron accuracy over the complete setup, necessary for the image correlation. This setup is currently in its final stage of construction and can be used for state-of-the-art research soon.

This system was developed and constructed in collaboration with the X-ray Microspectroscopy and Imaging group of Prof. L. Vincze (XMI) with the financial support of the Hercules Foundation (project AUGE/11/024. 2011).

Heracles

Specifications

There are 3 measurement stations that can be used separately or sequentially, without need for manual sample replacement.

Micro-XRF-CT station

  • Superflux MC X-Beam (XOS)
    • 50 kV, 50 W
    • Monocapillary focussing (20 µm spot, 8 mrad divergency)
  • 2 Sirius Series SDD (SGX Sensortech)
    • 150 mm² active area
    • 450 µm thick sensor
    • 25 µm DuraBe window

Micro-CT station

  • X-RAY WorX XWT-100-TCHR Microfocus X-ray tube
    • 100 kV, 100 W, W-anode
    • 1 µm spot size
  • Photonic Science VHR detector
    • 4008×2672 pixels
    • 9 µm pixel pitch
    • Gadox scintillator screen

Confocal XRF station

    • Superflux PF X-Beam (XOS)
      • 50 kV, 50 W
      • Polycapillary focussing (15 µm spot at Mo Ka)
    • 1 Sirius Series 100139-I SDD (SGX Sensortech)
      • 100 mm² active area
      • 450 µm thick sensor
      • 25 µm DuraBe window
    • 1 Sirius Series 100139-I SDD (SGX Sensortech) with confocal XOS polycapillary optic
      • 100 mm² active area
      • 450 µm thick sensor, 25 µm DuraBe window
      • 15 µm Field of View @17 keV (>= 10% transmission efficiency)

    Sample limitations*:

    • 4 cm diameter
    • max. 2.4 cm scan height
    • max. 500 g load

    *Additional limitations may apply depending on sample density and composition

    References

    More details can be found in the dedicated paper by Laforce et al.