About MoCCha-CT
In the project Model-coupled 4D-µCT for advanced material characterization (MoCCha-CT), we will develop several tools for X-ray imaging of dynamic processes in materials. Through a bi-directional coupling of this improved imaging data to simulation models, an enhanced scientific understanding of dynamic processes and structure inside samples will be accomplished. As such, the project's achievements will allow materials scientists to develop better and more sustainable materials.
The general objective outlined above will be achieved through a synergy between the following goals
- A novel dual phase grating interferometer for tuneable dark-field sensitivity for materials sciences will provide new possibilities for multi-scale material analysis and retrieving information about features beyond the intrinsic system resolution and the conventional trade-off between sample size and resolution in X-ray CT.
- Robust digital volume correlation algorithms, intensively coupled with tomographic reconstruction will significantly improve dynamic X-ray μCT and reduce motion artefacts.
- Development and/or improvement of simulation models for structures and dynamic processes applied to three different classes of materials, mineral building materials, composite materials and wood-based panels, each with a different state-of-the-art in terms of modelling. By coupling these models to the DVC and the tomographic reconstruction algorithms bi-directionally, an iterative optimization scheme for improving material models will be created.
- Achieve a bi-directional coupling of improved imaging data to simulation models will offer an enhanced scientific understanding of dynamic processes and structures inside samples. With this tool, we aim to allow materials scientists to develop better and more sustainable materials.
- The potential of these tools will be demonstrated by investigating structural and dynamic models in three different classes of materials: mineral building materials, composite materials and wood-based panels.