Electron Microscopy

Scanning electron microscopy

Scanning Electron Microscopy (SEM) uses electrons to acquire images of material surfaces, revealing their texture, structure, and composition at high resolution (down to nanometer level). Ghent University offers several state-of-the art SEM systems, each with a tailored specification including:

• High & low kV systems
• Low vacuum
• Chemical mapping using Energy Dispersive X-ray Spectroscopy (EDS)
• Crystallographic information from Electron Backscatter Diffraction (EBSD)
• In-situ testing capabilities

Transmission electron microscopy

Transmission electron microscopy (TEM) is the highest resolution imaging technique offered by the iMATCH platform with resolutions down to the sub-nanometer scale. We work together with the TEM core facility of Ghent University.